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@ -5,7 +5,13 @@
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-----
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### 논문
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![반도체 제조공정의 불균형 데이터셋에 대한 웨이퍼 불량 식별을 위한 심층 컨볼루션 신경망](https://file.notion.so/f/s/f80d2b5c-ac36-435b-8cef-19f3f5675940/(%EC%B5%9C%EC%A2%85)%EC%B0%B8%EA%B3%A0%EC%9E%90%EB%A3%8C_%EB%85%BC%EB%AC%B8_Wafer_Map_%EB%B6%88%EB%9F%89%EA%B2%80%EC%B6%9C_%EB%B2%88%EC%97%AD.pdf?id=805060e2-1f8d-4cc0-aba3-26e7b83ed5e9&table=block&spaceId=5c35ea55-42f1-4c42-b112-94f6eb8e2c2e&expirationTimestamp=1682615407281&signature=fK1nI4Wihr3P4g6i0RxbQ8insN8Gcr27vY5_DI0tctk&downloadName=%28%EC%B5%9C%EC%A2%85%29%EC%B0%B8%EA%B3%A0%EC%9E%90%EB%A3%8C_%EB%85%BC%EB%AC%B8_Wafer+Map+%EB%B6%88%EB%9F%89%EA%B2%80%EC%B6%9C_%EB%B2%88%EC%97%AD.pdf)
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![반도체 제조공정의 불균형 데이터셋에 대한 웨이퍼 불량 식별을 위한 심층 컨볼루션 신경망](https://ieeexplore.ieee.org/document/9093073)
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* 번역본
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https://gitea.pinblog.codes/attachments/9b2424f7-7e7d-4ad1-a368-86a523d67504
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* 원본
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https://gitea.pinblog.codes/attachments/9a31bb80-bc0a-4d5a-83b1-4ef0557456ad
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### Dataset
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[Kaggle - WDI Data](https://www.kaggle.com/qingyi/wm811k-wafer-map/code)
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