From 38f2c2c47d02bfd60c26dadd4017b8aabe259d73 Mon Sep 17 00:00:00 2001
From: pinb <deanpinb@gmail.com>
Date: Thu, 27 Apr 2023 16:00:36 +0000
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 ### 논문
-반도체 제조공정의 불균형 데이터셋에 대한 웨이퍼 불량 식별을 위한 심층 컨볼루션 신경망
+A Deep Convolutional Neural Network for Wafer Defect Identification on an Imbalanced Dataset in Semiconductor Manufacturing Processes 
+
+(반도체 제조공정의 불균형 데이터셋에 대한 웨이퍼 불량 식별을 위한 심층 컨볼루션 신경망)
 
 * [번역본](https://gitea.pinblog.codes/attachments/9b2424f7-7e7d-4ad1-a368-86a523d67504)