Releases Tags

• thesis 9cea53511c

  Compare

  main

  Argumentation

  Dataet

  info

  thesis

  Branches Tags

  ${ item.name }

  Create tag ${ searchTerm }

  Create branch ${ searchTerm }

  from 'main'

  ${ noResults }

  A Deep Convolutional Neural Network for Wafer Defect Identification on an Imbalanced Dataset in Semiconductor Manufacturing Processes Stable

  pinb released this 2 years ago | 0 commits to main since this release

  A Deep Convolutional Neural Network for Wafer Defect Identification on an Imbalanced Dataset in Semiconductor Manufacturing Processes

  https://ieeexplore.ieee.org/document/9093073

  Downloads

  • Source Code (ZIP)
  • Source Code (TAR.GZ)
  • 3.5 MiB (최종)참고자료_논문_Wafer Map 불량검출_번역.pdf
  • 1.3 MiB ADeepConvolutionalNeuralNetworkforWafer.pdf